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4200-SCS/F型

4200-SCS/F型
4200-SCS/F型半导体特性分析系统,带平板显示 - 直流I-V、C-V和脉冲集成在一个测试环境中
 
   The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests as well as provide precision measurement and high resolution with LCR meter support.
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地址:广州市荔湾区花地南路西塱麦村北约55号308房 电话:020-83709568 传真:020-83709252 邮箱:Email:mitek@21cn.com